The New Optical Device for Turn-to Turn Beam Profile Measurement

The electron beam quality determines the main synchrotron radiation characteristics therefore beam diagnostics is of great importance for synchrotron radiation source performance. The real-time processing of the electron beam parameters is a necessary procedure to optimize the key characteristics of the source using feedback loops. The frequency of electron beam cycling in the synchrotron storage ring is about 1 MHz. In multi-bunch mode electrons are grouped into a series of bunches. The bunch repetition frequency depends on the total number of bunches and usually reaches hundreds of MHz. The actual problem is to study multi-bunch beam instabilities. To solve this problem a turn-to-turn electron beam profile monitor is developed for Siberia-2 synchrotron light source. The linear avalanche photodiodes array is applied to imaging. The apparatus is able to record a transversal profile of selected bunches and analyze the dynamics of beam during 10 turns.